Method for determining capacitance of a device

ABSTRACT

A device and method of determining a capacitance of a device is provided, which in one embodiment includes connecting a first terminal of a capacitor having a known capacitance to the first terminal of the device, applying an AC voltage to the first terminal of the device and the first terminal of the capacitor, measuring a current through the capacitor, measuring a current through the device, determining a first voltage across the device as a function of time, computing a capacitance of the device as a function of time by multiplying the capacitance of the capacitor by the ratio of the current through the device to the current through the capacitor, determining a capacitance of the device as a function of voltage based on the capacitance as a function of time and the first voltage across the device as a function of time, and outputting data of the first capacitance of the device as a function of voltage.

This application is a divisional application of prior U.S. patentapplication Ser. No. 14/028,774 filed on Sep. 17, 2013, now U.S. Pat.No. 8,803,529, which was a divisional application of application Ser.No. 12/941,632, filed on Nov. 8, 2010, now U.S. Pat. No. 8,564,301,which are both hereby incorporated herein by reference, and prioritythereto for common subject matter is hereby claimed.

BACKGROUND OF THE INVENTION

The present invention generally relates to methods and devices fortesting electronics, and more particularly to methods and devices fordetermining the capacitance of a component.

Capacitance is a fundamental parameter of electronic components. It isimportant for a circuit designer to know a component's capacitance inorder to be able to design circuits that will perform as expected.Accurate knowledge of the capacitance of a component allows the circuitdesigner to select the appropriate component for the circuit. Forexample, low capacitance components may be desirable for achieving lowinsertion losses. Also, components having a low capacitance as afunction of voltage are desirable for low harmonics. Accordingly,accurate and relevant values of capacitance of components are needed bysystem designers.

Capacitance measurement of components having a capacitance that is notsimply a function of voltage, such as for thyristors, surge protectiondevices, and bidirectional transient voltage suppressors, can beespecially challenging. Such devices typically have diode isolatedinternal nodes that charge when the diodes are forward biased and remaincharged when the voltage is removed. These internal nodes discharge withleakage current over time. During use the nodes are recharged at thesignal frequency and therefore often do not have time to discharge.Thus, accurate measurement of the capacitance of such devices ischallenging because such measurement is both voltage and time dependent.

BRIEF DESCRIPTION OF THE DRAWINGS

The invention is further described in the detailed description thatfollows, by reference to the noted drawings by way of non-limitingillustrative embodiments of the invention, in which like referencenumerals represent similar parts throughout the drawings. As should beunderstood, however, the invention is not limited to the precisearrangements and instrumentalities depicted in the drawings:

FIG. 1 is a circuit diagram of a measurement system for determiningcapacitance of a device under test as a function of voltage of anexample embodiment according to the present invention;

FIG. 2 is a flow chart of a method for determining capacitance of adevice under test of an example embodiment according to the presentinvention;

FIG. 3 depicts signal waveforms determined via a method of an exampleembodiment according to the present invention;

FIG. 4 depicts capacitance as a function of voltage determined via amethod of an example embodiment according to the present invention;

FIG. 5 is a circuit diagram of a measurement system for determiningcapacitance of a device under test as a function of voltage via a secondexample embodiment according to the present invention;

FIG. 6 is a flow chart of a method for determining capacitance of adevice under test via a second example embodiment according to thepresent invention;

FIG. 7 depicts signal waveforms determined via a method of a secondexample embodiment according to the present invention; and

FIG. 8 depicts capacitance as a function of voltage determined via amethod of the second example embodiment according to the presentinvention.

DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS

In the following description, for purposes of explanation and notlimitation, specific details are set forth, such as particular devices,components, test equipment, connection methods, techniques, dataprotocols, software products and systems, operating systems, developmentinterfaces, hardware, etc. in order to provide a thorough understandingof the present invention.

However, it will be apparent to one skilled in the art that the presentinvention may be practiced in other embodiments that depart from thesespecific details. Detailed descriptions of well-known computers,devices, components, test equipment, connection methods, techniques,data protocols, software products and systems, operating systems,development interfaces, and hardware are omitted so as not to obscurethe description of the present invention.

According to an example embodiment of the present invention, a methodand device are provided for determining the capacitance of a deviceunder test (DUT). The method may be used for any electronic component,although the description below is provided in the context of a componenthaving a capacitance that is not simply a function of voltage, but isalso time dependent (e.g., dependent on the frequency of an appliedsignals). Such devices include, for example, thyristors, surgeprotection devices, and bidirectional transient voltage suppressors.

In various embodiments of the present invention, an alternating current(AC) voltage having a period that is less than an estimatedcharacteristic time of the DUT is applied across the DUT. Rather thanonly measure the magnitude and phase of the voltage and current at theDUT, a full voltage waveform of the voltage applied over time and a fullcurrent waveform of the current through the DUT over time are measuredconcurrently. The capacitance of the DUT may be calculated by dividingthe measured current through the DUT by the change in voltage withrespect to time of the applied AC voltage signal. The change in voltagewith respect to time may be calculated from the measured AC voltage orfrom the known parameters of the voltage source. In an alternativeembodiment, a capacitor is used (referred to herein as a referencecapacitor) having a known capacitance that is not a function of time(i.e., at the frequency of the applied AC signal) and preferably not afunction of voltage. The reference capacitor also receives the same ACvoltage signal and the measured current through the reference capacitoris used to determine the capacitance of the DUT. Specifically, thecapacitance of the DUT may be determined by multiplying the value of thereference capacitor by the ratio of the current through the DUT dividedby the current through the reference capacitor. In both embodiments, thecapacitance determined for the DUT is a function of voltage. In otherwords, a characteristic capacitance curve as a function of voltage maybe determined. The test and computations may be repeated with voltageshaving different amplitudes to provide a plurality of characteristiccapacitance curves, each associated with a different voltage range(although the voltage ranges may be overlapping). Different ACfrequencies also may be used.

It may be desirable to apply an AC voltage signal with alarge-amplitude, high frequency voltage that has a period that issubstantially less than the characteristic time for the DUT'scapacitance (i.e., the time the DUT takes to discharge by 1/e(approximately 63%) of the way to the final voltage). In someembodiments, a period that is “substantially less” than thecharacteristic time of the DUT's capacitance may comprise a period thatis less the characteristic time of the DUT's capacitance by a factor often, more preferably by a factor of fifty, yet more preferably by afactor of one hundred, and still more preferably by a factor of twohundred. When the DUT has a capacitance that is dependent on time (e.g.,frequency of the applied signal) and voltage, and an applied signal hasa period that is too long (relative to the characteristic time of theDUT), the determined capacitance of the DUT may be inaccurate. Forexample, for a thyristor, surge protection device, bidirectionaltransient voltage suppressor or other component having a capacitancethat is not simply a time-independent function of voltage, themeasurements may not be correct for the eventual application of the DUTwhere the applied signal's peak voltage levels are large anddetermination of the capacitance as a time-dependent function of voltageis desired.

Consider the example of a thyristor or a bidirectional transient voltagesuppressor (bidirectional TVS). Thyristors and bidirectional TVS's havediode isolated internal nodes. Such nodes charge when the diodes areforward biased by a voltage. The nodes remain charged when the voltageis removed. Of significance is that the charged nodes exhibit a reduceddiode capacitance. Gradually, these internal nodes discharge with aleakage current occurring over a typical discharge time (i.e., acharacteristic time) of up to tens of seconds. Under actual useconditions, the thyristor and bidirectional TVS will recharge during thenext cycle of the applied signal frequency, and thus may not have timeto fully discharge. Accordingly, when the AC voltage signal applied tothe DUT to determine the capacitance of the DUT has too low a frequencyor too low a voltage, the DUT will completely discharge during eachcycle of the applied AC signal. In some measurement conditions, thecapacitance may discharge within a small fraction of the period of theapplied signal. As a result, the component's computed capacitance may berated at or close to a maximum capacitance corresponding to a fullydischarged capacitance. Thus, the determined capacitance may be higherthan the capacitance experienced by a circuit having such a DUT in anactual use condition in which the capacitor does not fully dischargebefore being recharged.

Applying a small sine wave signal, or a small sine wave signalsuperimposed on a DC voltage, for example, may yield correct capacitanceversus information only for limited applications, or only for a DUThaving a capacitance value that is a function of voltage only. If theDUT has a time dependence capacitance, such measurements may not becorrect for an actual application where applied signal levels are largeand capacitance as a time-dependent function of voltage needs to bepredicted. Therefore, in many instance it is desirable that the appliedAC voltage for determining DUT capacitance have a large, high frequencyvoltage swing with a period that is substantially less than thecharacteristic time of the DUT's capacitance. This reduces thelikelihood that the DUT completely discharges before the next cycle ofthe applied AC signal, which more accurately simulates a use condition.

FIG. 1 depicts a first test configuration 10 for determining thecapacitance of a component by measuring voltage applied to, and currentthrough, a device under test 12. The test configuration 10 includes anAC voltage signal source 14, an oscilloscope 16, and in some embodimentsa current-to-voltage amplifier 18. The oscilloscope 16 may include or becoupled to a processor 40, computing device or other digital or analogcomputation circuit. Although in the illustrated embodiment the DUT 12is shown as back to back diodes, the DUT 12 may be any electroniccomponent.

A first terminal 20 of the DUT 12 is connected to the AC voltage signalsource 14 to receive the AC voltage signal. The first terminal 20 alsois coupled to a first channel 24 of the oscilloscope 16. A secondterminal 22 of the DUT 12 is coupled to a second channel 26 of theoscilloscope 16. For a DUT 12 having a very low capacitance, the secondterminal 22 may be coupled to the second channel 26 of the oscilloscope16 via a current-to-voltage amplifier 18 as is illustrated. For devicesnot having such a low capacitance, the current-to-voltage amplifier 18may be omitted so that the second terminal 22 of the DUT 12 is directlyconnected to the second channel 26 of the oscilloscope 16 (e.g., wherethe channel has a 50 ohm input impedance). In such a configuration, thecurrent may be computed as the measured voltage divided by the inputimpedance of the oscilloscope (e.g., V divided by fifty ohms). In thisexample embodiment, the second terminal 22 of the DUT 12 is coupled to afirst input 28 of the amplifier 18, while the amplifier 18 output iscoupled to the oscilloscope's second channel 26. The amplifier 18 may beformed, for example, by an operational amplifier 30 and a resistor 32that is coupled across the operational amplifier output and the firstinput 28 of the operational amplifier 30. The AC voltage signal source14, the oscilloscope 16, and the second input 34 of the amplifier 30 aregrounded commonly.

FIG. 2 is a flow chart of a method for determining capacitance of a DUTaccording to a first example embodiment of the present invention. At202, the first terminal of the DUT 12 is connected to a first channel 24of the oscilloscope 16. At 204, the second terminal of the DUT isconnected to the second channel 26 of the oscilloscope 16. The secondterminal of the DUT may be connected to the second channel directly orvia an amplifier as illustrated in FIG. 1. At 206, the AC voltage signalsource 14 supplies an AC voltage signal to the first terminal 20 of theDUT 12. The instantaneous voltage at the DUT first terminal 20 over timeis measured by the oscilloscope's first channel 24 at 208. While thisexample embodiment measures the voltage applied to the DUT through useof the oscilloscope 16, in other embodiments a known voltage may beapplied thereby eliminating the need to measure the voltage supplied tothe DUT. At 210, the instantaneous current through the DUT 12 over timeis measured by the oscilloscope's second channel 26. The measuredvoltage and current also may be displayed and recorded by theoscilloscope 16.

At 212, the capacitance of the DUT 12 is computed as the current throughthe DUT 12 (as measured by the second channel) divided by the change inDUT voltage at the input of the DUT 212 (as measured by the firstchannel) with respect to time (dV/dt) or by the following equation:C(t)=I(t)/(dV/dt);  Equation A

-   -   where:    -   I(t)=the current through the DUT over time as measured by the        second channel of the oscilloscope 16.    -   dV/dt=the change in voltage with respect to time at the first        terminal of the DUT as measured by the first channel of the        oscilloscope. In other words, the derivative with respect to        time of the data from the first channel is used.        Such computation may be performed by processor 40, a computing        device, or other digital or analog circuit in or communication        with (or receiving the data from) the oscilloscope 16. Those        skilled in the art will recognize that in this embodiment the        above equation does not include a coefficient (i.e., to factor        in the amplifier gain and/or a conversion factor to convert a        measured voltage to current), because such data may be inputted        into the oscilloscope or into the automated software of the        computing device and therefore need not to be included        separately into the above equation (i.e., such coefficient is        already factored in). In other embodiments, where the computing        device does not accept such data, the above equation may include        a coefficient. Having determined capacitance as a function of        time from the equation above, and having the measured voltage        (or known applied voltage) as a function of time, the        capacitance can be plotted versus voltage on a time point by        time point bases to provide the capacitance as a function of        voltage (C(V)) at 213. The computed capacitance as a function of        voltage may be outputted in tabular or graphical form at 214.

FIG. 3 depicts graphs (a)-(d) of signal waveforms measured or determinedusing test configuration 10 of FIG. 1 implementing the examplecapacitance determination method of FIG. 2. Graph (a) depicts a waveform302 of the voltage measured at the first channel 24 of the oscilloscope16 as a function of time with voltage corresponding to the vertical axisand time corresponding to the horizontal axis. In this example, atriangular wave AC signal is generated by the AC voltage signal source14 and applied to the first terminal 20 of the DUT 12. Although thetriangular waveform is used in this embodiment, the AC voltage signalmay have other characteristic shapes in alternate embodiments. A benefitof the triangular waveform is that the applied AC signal maintains alarge dV/dt with respect to the maximum voltage as compared, forexample, to a sine wave. While this example embodiment measures thevoltage applied to the DUT through use of the oscilloscope 16, in otherembodiments a known voltage may be applied thereby eliminating the needto measure the voltage supplied to the DUT.

Graph (b) depicts a waveform 304 of the change in voltage over time(i.e., dV/dt) with dV/dt corresponding to the vertical axis and timecorresponding to the horizontal axis. The data for dV/dt may be obtainedby computing the derivative of the applied voltage with respect to time(i.e., derivative of the data from the oscilloscope first channel 24(depicted in graph (a)) or, an alternate embodiment, the derivative ofthe applied known voltage). The derivative may be computed by theoscilloscope or by post processing software executing on a computer thatreceives the measurement data from the oscilloscope. For an appliedtriangular wave voltage signal the dV/dt waveform 304 has a generallysquare wave shape as is illustrated.

Graph (c) depicts a waveform 306 of the current through the DUT that ismeasured at the second channel 26 of the oscilloscope 16 as a functionof time (i.e., l(t)) with current corresponding to the vertical axis andtime corresponding to the horizontal axis. It is noted that although thecurrent from the second terminal 22 of the DUT may pass through theamplifier 18, the signal received at the oscilloscope second channel 26is proportional to the current through the DUT 12. The current waveform306 has a generally curved portion 312 (at a first polarity) during thecorresponding increase in V(t), and an opposite generally curved portion314 (at an opposite polarity) during the corresponding decrease in V(t).These curved portions 312 and 314 are related to the capacitance as afunction of voltage or C(V).

Graph (d) depicts a waveform 308 of the capacitance of the DUT as afunction of time (i.e., C(t)) computed using Equation A and data fromwaveforms 304 and 306, with capacitance corresponding to the verticalaxis and time corresponding to the horizontal axis. The vertical lines310 correspond to times at which the dV/dt polarity changes (whichcorrespond to the amplitude peaks of the applied voltage V(t)).

As discussed above, the capacitance of the device is computed as:C(t)=1(t)/(dV/dt)

Having determined capacitance as a function of time from the equationabove, and having the measured voltage (or known applied voltage) as afunction of time, the capacitance can be plotted versus voltage on atime point by time point bases to provide the capacitance as a functionof voltage (C(V)) for the applied voltage. FIG. 4 depicts a waveform 402of the DUT capacitance as a function of voltage, with capacitancecorresponding to the vertical axis and voltage corresponding to thehorizontal axis. Thus, the graph of FIG. 4 may be generated by the datacollected over one cycle of the applied AC signal such as, for example,a time point by time point plot of the capacitance data of graph (d) ofFIG. 3 versus the voltage data from graph (a) of FIG. 3. It also may benecessary to shift the data from one or both oscilloscope channels(i.e., a time shift to ensure the measurement data of the channels issynchronized in time) to account for different cable lengths (of thecables connected to the oscilloscope), especially at higher frequencies.Comparing the capacitance to the applied voltage (graph (a)), as thevoltage across the DUT approaches zero, capacitance decreases. As thevoltage increases or decreases away from zero volts, the capacitanceincreases. Of particular interest is that the peak capacitance may beless than a maximum capacitance for the DUT that would be obtained byusing a voltage signal having too long of a period (i.e., longer thanthe DUT capacitance characteristic time) or by using a small AC signalmethod with a DC bias to determine capacitance versus voltage. Also, ofinterest is that the capacitance varies during the entire period of theapplied AC voltage signal. Under a test condition having a periodsubstantially greater than the characteristic time, the capacitance as afunction of voltage may be very different. Accordingly, the rated,average capacitance of a component might be incorrectly computed to betoo high and not reflect the variations depicted in FIG. 4. The valuesdepicted in FIG. 4 may be output, stored and associated with the deviceunder test 12 to characterize the DUT capacitance as a function ofvoltage. The test may be repeated using AC voltage signals havingdifferent amplitudes (and in some instances different frequencies) sothat a plurality of curves is generated. Such characteristic capacitancecurves may be beneficial for design engineers when selecting orotherwise evaluating a component to be included in a circuit. It isworth noting that different devices may have different values anddifferent curve shapes than those depicted herein.

FIG. 5 depicts a test configuration 50 of a second example embodiment ofthe present invention for determining the capacitance of a device undertest 12. The test configuration 50 of FIG. 5 is similar to the testconfiguration 10 of FIG. 1 with like components given the same labelnumbers. The test configuration 50 includes an AC voltage signal source14, a reference capacitor (C_(Ref)) 52, an oscilloscope 16, and in someembodiments one or more current-to-voltage amplifiers 18, 56. Althoughin the illustrated embodiment the DUT 12 is shown as back to backdiodes, the DUT 12 may be any electronic component. The referencecapacitor 52 has a known capacitance over the applied voltage range andwhich is substantially independent of (and constant at) the voltage andfrequency of the applied voltage signal. The oscilloscope 16 may includeor be coupled to a processor 40, computing device or other digital oranalog computation circuit. Inclusion of the reference capacitor 52 anduse of the current through the reference capacitor 52 in determining thecapacitance of the DUT avoids errors that may occur when determiningdV/dt of the previously described embodiment.

The DUT 12 may have a first terminal 20 which receives the AC voltagesignal from the AC voltage signal source 14, and is coupled to a firstchannel 58 of the oscilloscope 16. The DUT 12 may have a second terminal22 which is coupled to a second channel 62 of the oscilloscope 16,either directly or via a current-to-voltage amplifier 18 (as isillustrated), such as an amplifier 18 having a configuration aspreviously described with regard to FIG. 1.

The reference capacitor 52 has a first terminal that also receives theAC voltage signal from the AC voltage signal source 14, and thereforealso is coupled to the first channel 58 of the oscilloscope 16. A secondterminal of the reference capacitor 52 is coupled to a third channel 60of the oscilloscope 16, either directly or via anothercurrent-to-voltage amplifier 56 (as is illustrated). Thecurrent-to-voltage amplifier 56 may be configured in the same manner ascurrent-to-voltage amplifier 18, with the output coupled to theoscilloscope and a feedback resistor coupled between the output and theone of the inputs (and the reference capacitor 52). The AC voltagesignal source 14, the oscilloscope 16, (and if incorporated into thetest configuration, the amplifiers' second inputs) are connected to acommon ground.

FIG. 6 is a flow chart of a method for determining capacitance of thedevice under test according to the second example embodiment of thepresent invention. At 602, the first terminal 20 of the DUT 12 isconnected to the first channel 58 of the oscilloscope 16 and the ACvoltage signal source 14 to measure the instantaneous voltage applied tothe DUT 12. At 604, a first terminal of the reference capacitor 52 isconnected to the first terminal 20 of the DUT 12, the first channel 58of the oscilloscope 16, and the AC voltage signal source 14.Accordingly, the AC voltage signal is commonly applied to the DUT 12 andthe reference capacitor 52. At 606, the second terminal 22 of the DUT isconnected to a second channel 62 of the oscilloscope 16, such asdirectly or via the current amplifier 18, to measure the current throughthe DUT 12. At 608, the second terminal of the reference capacitor 52 isconnected to a third channel 60 of the oscilloscope 16, such as directlyor via the current-to-voltage amplifier 56, to measure the currentthrough the reference capacitor 52. The measured currents and voltagemay be output, displayed and recorded by the oscilloscope 16. At 610,the AC voltage signal source 14 supplies an AC voltage signal to thereference capacitor 52 and the DUT 12.

At 612, the voltage applied to the DUT 12 is determined by measurementat the first channel 58 of the oscilloscope 16. In other embodiments, aknown voltage source may be used so that so that measurement is notnecessary (and processes 602 and 604 may be omitted). At 614, thecurrent through the DUT 12 is measured at the second channel 62 of theoscilloscope 16. At 616, the current through the reference capacitor 52is measured at the third channel of the oscilloscope. At 618, thecapacitance of the DUT 12 is computed by multiplying capacitance of thereference capacitor (capacitor 52) by the ratio of the current throughthe DUT divided by the current through the reference capacitor(capacitor 52) as illustrated by the following equation:C _(DUT)(t)=C _(Ref) *[l _(DUT)(t)/I _(Ref)(t)]  Equation B

-   -   where:    -   C_(Ref)=the capacitance of the reference capacitor 52;    -   I_(DUT)(t)=the current through the DUT 12 over time as measured        by the second channel of the oscilloscope 16; and    -   I_(Ref)(t)=the current through the reference capacitor 52 over        time as measured by the third channel of the oscilloscope 16.

Computation of the equation may be performed by a processor 40,computing device, or other digital or analog circuit in or coupled tothe oscilloscope 16 or that is provided the data. Those skilled in theart will recognize that in this embodiment the above equation does notinclude a coefficient (to factor in the amplifier gain and/or aconversion factor to convert a measured voltage to current), becausesuch data may be inputted into the oscilloscope or into the automatedsoftware of the computing device and therefore need not to be includedseparately into the above equation (i.e., such coefficient is alreadyfactored in). In other embodiments, where the computing device does notaccept such data, the above equation may include a coefficient. Havingdetermined capacitance as a function of time from the equation above,and having the measured voltage (or known applied voltage) as a functionof time, the capacitance can be plotted versus voltage on a time pointby time point bases to provide the capacitance as a function of voltage(C(V)) at 619. The capacitance as a function of voltage is outputted intabular or graphical format at 620.

FIG. 7 depicts signal waveforms measured or determined by the testconfiguration 50 implementing the example component capacitancedetermination method of FIG. 6. Graph (f) depicts a waveform 702 of theapplied voltage as a function of time (i.e., V(t)) measured at the firstchannel 58 of the oscilloscope 16 with voltage corresponding to thevertical axis and time corresponding to the horizontal axis. Asdiscussed, if a known voltage is applied, the voltage need not bemeasured. In this example, a triangular wave AC signal is generated bythe AC voltage signal source 14.

Graph (g) depicts a waveform 704 of the current through the referencecapacitor 52 as a function of time (i.e., I_(Ref)(t)) measured at thethird channel 60 of the oscilloscope 16, with current corresponding tothe vertical axis and time corresponding to the horizontal axis. It isnoted that although the current through the reference capacitor 52 maypass through the current-to-voltage amplifier 56, the signal received atthe oscilloscope third channel 60 is proportional to the current throughthe reference capacitor 52. For an applied triangular AC voltage signal,the I_(REF)(t) waveform 704 has a generally square wave form since thecapacitance of the reference capacitor is constant over the appliedvoltage.

Graph (h) depicts a waveform 706 of the current through the DUT as afunction of time (i.e., I_(DUT)(t)) measured at the second channel 62 ofthe oscilloscope 16 with current corresponding to the vertical axis andtime corresponding to the horizontal axis. It is noted that although thesignal from the second terminal 22 of the DUT 12 may pass through thecurrent-to-voltage amplifier 18, the signal received at the oscilloscopesecond channel 62 is proportional to the current through the DUT 12.Waveform 706 (i.e., I_(DUT)(t)) has a generally curved portion 712 (at afirst polarity) during the increase in V(t), and an opposite generallycurved portion 714 (at an opposite polarity) during the decrease inV(t). These curved portions 712 and 714 are related to the capacitanceas a function of voltage or C(V) and may be outputted and stored.

Graph (i) depicts a waveform 708 of the capacitance of the DUT as afunction of time (i.e., C(t)) computed using Equation B and data fromwaveforms 704 and 706, with capacitance corresponding to the verticalaxis and time corresponding to the horizontal axis. The vertical lines710 occur at instances when the direction of the current through the DUTchanges.

As discussed above, the capacitance of the DUT in this exampleembodiment may be computed according to the following equation:C _(DUT)(t)=C _(Ref)(t)*[I _(DUT)(t)/I _(Ref)(t)]Having determined capacitance as a function of time from the equationabove, and having measured voltage as a function of time, thecapacitance can be plotted versus voltage on a time point by time pointbases to provide the capacitance as a function of voltage (C(V)) for theapplied voltage. FIG. 8 depicts a graph of the capacitance 802 of theDUT as a function of voltage with capacitance corresponding to thevertical axis and voltage corresponding to the horizontal axis. Thus,the graph of FIG. 8 may be generated by the data collected over onecycle of the applied AC signal such as, for example, a time point bytime point plot of capacitance data of graph (i) of FIG. 7 versus thevoltage data from graph (f) of FIG. 7. It also may be necessary to shiftthe data from one or all oscilloscope channels (i.e., a time shift toensure the measurement data of the channels is synchronized in time) toaccount for different cable lengths (of the cables connected to theoscilloscope), especially at higher frequencies. As the amplitude of thevoltage across the DUT increases (positively or negatively), thecapacitance increases. Of particular interest is that the peakcapacitance may be less than a maximum capacitance for the DUT thatwould be obtained by using a voltage signal having too long of a period(i.e., longer than the DUT capacitance characteristic time) or using asmall signal measurement technique. Also of interest is that thecapacitance is varying during the entire period of the applied ACvoltage signal. Under an applied voltage signal having a period greaterthan the characteristic time, the capacitance may have a very differentcapacitance as a function of voltage. Accordingly, average capacitanceof a component might be incorrectly calculated as too high and notreflect the variation depicted in graph (j) of FIG. 8. The values on thegraph (j) may be output, stored and associated with the device undertest 12 to characterize the DUT capacitance as a function of voltage.The test may be repeated using AC voltage signals having differentamplitudes so that a plurality of curves is generated. Suchcharacteristic curve may be beneficial for design engineers whenselecting or otherwise evaluating a component to be included in acircuit or system.

In either of the above described embodiments, the amplitude of theapplied AC voltage signal may be varied during a test to determine theresponse time of the DUT with regard to changes in signal amplitude. Theresponse time also may be output.

The embodiments of the present invention provide methods and devicesthat are able to measure capacitance under conditions that more closelycorrespond to actual use conditions. The characteristic capacitancecurves 402, 802 obtained according to various embodiments of the presentinvention may be beneficial to design engineers seeking to determine (orreduce) the harmonics, response times, insertion losses, and otherperformance characteristics of a component. For example, a lowcapacitance versus voltage indicates lower harmonics.

Prior to performing the above described example tests, it may bedesirable to estimate the capacitance or to determine the capacitanceusing a conventional method (capacitance determined by either methodreferred to herein as an estimated capacitance). The estimatedcapacitance may be used as a basis to determine the characteristic timeof the DUT and to determine whether amplifier 18 should be incorporated.For example, by multiplying a measured leakage current of a DUT by anestimated capacitance (e.g., determined by small signal applicationmethod), the characteristic time may be determined, which may be used toselect the frequency of the applied AC voltage signal for the abovedescribed example embodiments.

While the above described embodiments employ an oscilloscope, otherembodiments may instead use other test devices such a specificallydesigned test device having a digital signal processor (DSP) that isadapted to measure the voltage and current(s) and to compute and outputthe capacitance curves.

Thus, in one example embodiment the method of determining a capacitanceof a device having a first terminal and a second terminal comprisesconnecting the first terminal of the device to a first channel of anoscilloscope, connecting a first terminal of a capacitor having a knowncapacitance to the first terminal of the device, connecting a secondterminal of the device to a second channel of the oscilloscope,connecting a second terminal of the capacitor to a third channel of theoscilloscope, supplying an alternating current (AC) voltage to the firstterminal of the device and the first terminal of the capacitor,determining a voltage as a function of time across the device whilesupplying the AC voltage from information collected by the first channelof the oscilloscope, determining a current through the device frominformation collected by the second channel of the oscilloscope whilesupplying the AC voltage to the first terminal of the device,determining a current through the capacitor from information collectedby the third channel of the oscilloscope while supplying the AC voltageto the first terminal of the capacitor, computing a capacitance of thedevice as a function of time by multiplying the capacitance of thecapacitor by the ratio of the current through the device to the currentthrough the capacitor, determining a capacitance of the device as afunction of voltage based on the computed capacitance as a function oftime and the voltage across the device as a function of time, andoutputting data of the capacitance of the device as a function ofvoltage. Computing a capacitance of the device as a function of time maycomprise multiplying the capacitance of the capacitor by the ratio ofthe current through the device to the current through the capacitor fora plurality of voltages of a single cycle of the applied AC voltage.

In another example embodiment, the method of determining a capacitanceof a device having a first terminal and a second terminal may compriseconnecting a first terminal of a capacitor having a known capacitance tothe first terminal of the device, applying an AC voltage having a firstamplitude to the first terminal of the device and the first terminal ofthe capacitor, measuring an instantaneous current through the capacitorwhile applying the AC voltage having the first amplitude to the firstterminal of the capacitor, measuring an instantaneous current throughthe device while applying the AC voltage having the first amplitude tothe first terminal of the device, determining a first voltage across thedevice as a function of time while the AC voltage having the firstamplitude is applied to the first terminal of the device, computing afirst capacitance of the device as a function of time by multiplying thecapacitance of the capacitor by the ratio of the instantaneous currentthrough the device to the instantaneous current through the capacitorduring application of the AC voltage having the first amplitude,determining a first capacitance of the device as a function of voltagebased on the first capacitance as a function of time and the firstvoltage across the device as a function of time, and outputting data ofthe first capacitance of the device as a function of voltage. Computinga first capacitance of the device as a function of time comprisesmultiplying the capacitance of the capacitor by the ratio of theinstantaneous current through the device to the instantaneous currentthrough the capacitor for a plurality of voltages of a single cycle ofthe applied AC voltage. The method may further include changing anamplitude of the applied AC voltage, measuring a response time of thedevice, and outputting data of the measured response time.

In yet another example embodiment, the method of determining acapacitance of a device having a first terminal and a second terminalmay comprise connecting a first terminal of a capacitor having a knowncapacitance to the first terminal of the device, applying an AC voltageto the first terminal of the device and the first terminal of thecapacitor, measuring a plurality of instantaneous currents through thecapacitor while applying the AC voltage, concurrently with saidmeasuring a plurality of currents through the capacitor, measuring aplurality of instantaneous currents through the device, wherein each ofthe plurality of measured instantaneous currents through the capacitorcorresponds in time to one of the plurality of measured instantaneouscurrents through the device, for each of the plurality of measuredinstantaneous currents through the capacitor and the corresponding oneof the plurality of measured instantaneous currents through the device,multiplying the capacitance of the capacitor by the ratio of themeasured instantaneous current through the device to the measuredinstantaneous current through the capacitor to provide a capacitance ofthe device as a function of time, determining a capacitance of thedevice as a function of voltage based on the computed capacitance as afunction of time and a voltage across the device as a function of time,and outputting data of the capacitance of the device as a function ofvoltage.

In still another example embodiment, the invention may take the form ofa computer program product comprising a tangible computer usable mediumhaving a computer readable program code embodied therein, the computerreadable program code adapted to be executed to implement a method fordetermining a capacitance of a device, the method comprising receivingdata of an instantaneous current through a capacitor while an AC voltageis supplied to a first terminal the capacitor, receiving data of aninstantaneous current through the device while the AC voltage issupplied to a first terminal the device, receiving data of a voltageacross the device as a function of time, wherein the first terminal ofthe device is connected to the first terminal of the capacitor and thedata of the instantaneous current through the device and the data of theinstantaneous current through the capacitor are from measurements takeconcurrently, for a plurality of voltages across the device, computing acapacitance of the device as a function of time by multiplying acapacitance of the capacitor by a ratio of the instantaneous currentthrough the device to the instantaneous current through the capacitor,determining a capacitance of the device as a function of voltage basedon the computed capacitance as a function of time and the data of thevoltage across the device as a function of time; and outputting data ofthe capacitance of the device as a function of voltage.

It is to be understood that the foregoing illustrative embodiments havebeen provided merely for the purpose of explanation and are in no way tobe construed as limiting of the invention. Words used herein are wordsof description and illustration, rather than words of limitation. Inaddition, the advantages and objectives described herein may not berealized by each and every embodiment practicing the present invention.Further, although the invention has been described herein with referenceto particular structure, materials and/or embodiments, the invention isnot intended to be limited to the particulars disclosed herein. Rather,the invention extends to all functionally equivalent structures, methodsand uses, such as are within the scope of the appended claims. Thoseskilled in the art, having the benefit of the teachings of thisspecification, may affect numerous modifications thereto and changes maybe made without departing from the scope and spirit of the invention.

What is claimed is:
 1. A method of determining a capacitance of a devicehaving a first terminal and a second terminal, comprising: connectingthe first terminal of the device to a first channel of an oscilloscope;connecting a first terminal of a capacitor having a known capacitance tothe first terminal of the device; connecting a second terminal of thedevice to a second channel of the oscilloscope; connecting a secondterminal of the capacitor to a third channel of the oscilloscope;supplying an alternating current (AC) voltage to the first terminal ofthe device and the first terminal of the capacitor; determining avoltage as a function of time across the device while supplying the ACvoltage from information collected by the first channel of theoscilloscope; determining a current through the device from informationcollected by the second channel of the oscilloscope while supplying theAC voltage to the first terminal of the device; determining a currentthrough the capacitor from information collected by the third channel ofthe oscilloscope while supplying the AC voltage to the first terminal ofthe capacitor; computing a capacitance of the device as a function oftime by multiplying the capacitance of the capacitor by the ratio of thecurrent through the device to the current through the capacitor;determining a capacitance of the device as a function of voltage basedon the computed capacitance as a function of time and the voltage acrossthe device as a function of time; and outputting data of the capacitanceof the device as a function of voltage.
 2. The method according to claim1, wherein said connecting the second terminal of the device to thesecond channel of the oscilloscope, comprises: connecting the secondterminal of the device to the second channel of the oscilloscope throughan amplifier.
 3. The method according to claim 1, wherein saidconnecting the second terminal of the capacitor to the third channel ofthe oscilloscope, comprises: connecting the second terminal of thecapacitor to the third channel of the oscilloscope through an amplifier.4. The method according to claim 1, wherein the AC voltage comprises atriangle wave.
 5. The method according to claim 1, wherein saidcomputing a capacitance of the device as a function of time comprisesmultiplying the capacitance of the capacitor by the ratio of the currentthrough the device to the current through the capacitor for a pluralityof voltages of a single cycle of the applied AC voltage.
 6. The methodaccording to claim 1, wherein the AC voltage has a period that is lessthan the characteristic time for a capacitance as a function of time ofthe device by factor of at least ten.
 7. A computer program productcomprising a non-transitory tangible computer usable medium having acomputer readable program code embodied therein, said computer readableprogram code adapted to be executed to implement a method fordetermining a capacitance of a device, comprising: connecting a firstterminal of the device to a first terminal of a capacitor, the capacitorhaving a first capacitance that is not a function of time and thecapacitance of the device having a function of time; receiving data ofan instantaneous current through the capacitor while an AC voltage issupplied to the first terminal of the capacitor and receiving data of aninstantaneous current through the device while the AC voltage issupplied to the first terminal the device; receiving data of a voltageacross the device as a function of time; wherein the data of theinstantaneous current through the device and the data of theinstantaneous current through the capacitor are from measurements takenconcurrently; determining the capacitance of the device as a function oftime by multiplying the first capacitance of the capacitor by a ratio ofthe instantaneous current through the device to the instantaneouscurrent through the capacitor; determining a capacitance of the deviceas a function of voltage based on the determined capacitance as afunction of time and the data of the voltage across the device as afunction of time; and outputting data of the capacitance of the deviceas a function of voltage.
 8. The computer program product according toclaim 7, wherein said computing the capacitance of the device as thefunction of time comprises multiplying the capacitance of the capacitorby the ratio of the instantaneous current through the device to theinstantaneous current through the capacitor for a plurality of voltagesof a single cycle of the supplied AC voltage.